IMS 1280 Ultra High Sensitivity Magnetic Sector SIMS from CAMECA
The IMS 1280 is based on a double focusing mass spectrometer with a large radius magnetic sector. The secondary ion optics has been optimized to work at full transmission up to 6,000 mass resolving...
View ArticleSC Ultra High Performance Magnetic Sector SIMS from CAMECA
The CAMECA SC Ultra has been specifically designed to meet the increasing needs for dynamic SIMS measurements in advanced semiconductors. The design of the CAMECA SC Ultra is quite unique: along with...
View ArticleNanoSIMS 50/50 L SIMS Microprobe from CAMECA
The CAMECA NanoSIMS 50 is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion...
View ArticleAutoSIMS: Automatic Surface Analysis System
The Hiden AutoSIMS is a self-contained, automated, SIMS tool designed to perform routine and repetitive surface analysis. It is perfect for the measurement of thin films, contamination and doping from...
View ArticleMAXIM Quadruple SIMS Analyzer from Hiden
The Hiden MAXIM quadruple SIMS analyzer is a system for dynamic and static SNMS and SIMS applications. This analyzer is a state of the art secondary ion mass spectrometer for negative and positive,...
View ArticleToF-qSIMS Workstation: Combining Time-of-Flight and Quadrupole Analyzers in a...
The Hiden ToF-qSIMS Workstation uniquely combines both time-of-flight and quadrupole analyzers in a single SIMS instrument.
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